TS-DEM Development of Electronic Modules Group
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TS-DEM Development of Electronic Modules Group. Erik van der Bij CERN. Agenda. Services and organisation of TS-DEM Organisation of files in EDMS (AB/PO) Reliability engineering. MANDATE Turn schematics into boards (standard + special). PCB design Manufacture of special circuits and PCBs - PowerPoint PPT Presentation
Transcript of TS-DEM Development of Electronic Modules Group
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Selon convention signe par AB-PO et TS-DEM (Document EDMS 801714 v1)1 carte: HCRBSxxxxx = EDA-yyyyy-Vx-xUn dossier de fabrication unique GEREGHCREHAR002Code de fabrication TS-DEM: EDA-xxxxx-Vx-xCode dexploitation AB-PO : HCRBSxxxxxEnregistrement des cartes fabriques par TS/DEM Christophe Mugnier :Prsentation du 16 Juin 2006
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Dossiers de fabrication TS/DEM Christophe Mugnier :Prsentation du 16 Juin 2006
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Dossiers de fabrication TS/DEM - Identification d'une carte La srigraphie de la face avant:Elle comporte le code EDA et la dsignation de la carte.Etiquette appose par lassembleur sur le connecteur dans le cas dune excution.La srigraphie du print: Elle comporte le code EDA+la version et la dsignation de la carte.
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Dossiers de fabrication TS/DEM - Identification d'un chassis La srigraphie de la face avant:Elle comporte le code EDA et la dsignation du chassis.Etiquette appose par lassembleur pour spcifier la version.
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Dossiers de fabrication TS/DEM - Example en EDMS Example:http://edms.cern.ch/nav/eda-01586
CERN TS -DEM CERNErik van der Bij
Reliability engineeringIn development phase: qualitative strategyFind weak points fast - whatever it takes
Accelerated testing: quantative strategyget idea of final reliabilityconcepts (without acceleration) also valid to get data for our installed base
Ideas from Hobbs Engineering course "Demonstrating Reliability Requirements with Accelerated Testing" and book "Accelerated Reliability Engineering - HALT and HASS"http://hobbsengr.com, see also http://weibull.com
CERN TS -DEM CERNErik van der Bij
Stress-Strength "Non-interference"
CERN TS -DEM CERNErik van der Bij
Qualitative strategy
CERN TS -DEM CERNErik van der Bij
Effect of qualitative testing
CERN TS -DEM CERNErik van der Bij
HALT
CERN TS -DEM CERNErik van der Bij
PDF to CDFProbabilityTimeTimeUnreliabilityUnreliabilityTime
CERN TS -DEM CERNErik van der Bij
Weibull function handles all shapes
CERN TS -DEM CERNErik van der Bij
Paperclip example
CERN TS -DEM CERNErik van der Bij
Calibrated Accelerated Lifetime Test
CERN TS -DEM CERNErik van der Bij
Example of Voltage CALTCar electronics 12-15 Volt
CERN TS -DEM CERNErik van der Bij
Example of Tcycle CALT
CERN TS -DEM CERNErik van der Bij
Wiper graph
CERN TS -DEM CERNErik van der Bij
A serious test flow
CERN TS -DEM CERNErik van der Bij
ConclusionsDevelopmenthave fun with your cards and 'burn' a few. You learn a lot!temperature, voltage, vibration, on/off cycles...Know (measure) the environment of your cardse.g. on-time, on/off cyles and temperature variationsis needed to calibrate acceleration factorsMeasure precisely the on-time, on/off cycles etc of each card to know precisely when failedallows Weibull plotting and gives invaluable reliability data
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